A coarse pixel-scale ground “truth” dataset based on global in situ site measurements to support validation and bias correction of satellite surface albedo products

Pan, Fei; Wu, Xiaodan; Zeng, Qicheng; Tang, Rongqi; Wang, Jingping; Lin, Xingwen; You, Dongqin; Wen, Jianguang; Xiao, Qing

doi:https://doi.org/10.5194/essd-16-161-2024

Articles | Volume 16, issue 1

https://doi.org/10.5194/essd-16-161-2024

© Author(s) 2024. This work is distributed under
the Creative Commons Attribution 4.0 License.

https://doi.org/10.5194/essd-16-161-2024

© Author(s) 2024. This work is distributed under
the Creative Commons Attribution 4.0 License.

Articles | Volume 16, issue 1

Data description paper

|

10 Jan 2024

Data description paper |

| 10 Jan 2024

A coarse pixel-scale ground “truth” dataset based on global in situ site measurements to support validation and bias correction of satellite surface albedo products

Fei Pan, Xiaodan Wu, Qicheng Zeng, Rongqi Tang, Jingping Wang, Xingwen Lin, Dongqin You, Jianguang Wen, and Qing Xiao

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